ELECTRON MICROSCOPY
The electron microscope facilities of the CRNN consists of a 200 KV Transmission Electron Microscope system, a Field-emission Scanning Electron Microscope and a Variable Pressure Scanning Electron Microscope for investigation of biological materials.
TRANSMISSION ELECTRON MICROSCOPY
MODEL: JEOL JEM 2100 HR with EELS
| Resolution | Point to Point resolution of 0.23 nm & lattice resolution of 0.14 nm |
| Accl. Voltage | 80 KV to 200 KV |
| Modes of Operation | TEM, EDS, NBD & CBD |
| Source | LaB6 |
| Sample holders | Heating holder (800C) |
| Cooling holder (-160C) | |
| Tilting holder | |
| Straining holder | |
| Cryotransfer system | |
| EDS | INCA Energy TEM 200 with analysis software |
| EELS | Model 963 GIF Quantum Imaging Filter System |
| Energy resolution:0.7ev | |
| EELS/EFTEM software |
FIELD EMISSION SCANNING ELECTRON MICROSCOPY
MODEL JEOL JSM-7600F
| Voltage | 100V to 30KV |
| Source | Thermal Field Emission Gun (ZrO-W) |
| Resolution | 1 nm at 15KV & 1.5 nm at 1KV |
| Probe current | up to 200A |
| Detectors | Secondary Electron Detector |
| Back-scatter Electron Detector | |
| EDS/EBSD | INCA Energy 250 & HKL Advanced EBSD system |
| CL | Mono CL 4 (Gatan) |
SCANNING ELECTRON MICROSCOPE for Biological Samples
MODEL: ZEISS EVO-MA 10
| Resolution | 3nm |
| Source | Tungsten Filament |
| Antimony | |
| EDS | INCA Energy 250 Microanalysis System (EDS) |
| Upgradation to life science model | Variable pressure range from 400 to 3000 Pa |
| Extended pressure secondary electron detector | |
| Water vapor introduction kit | |
| Peltier cooled stage | |
| Cryo transfer | Quorum Tech Cryo Transfer system |
| In situ fracture | |
| In situ coater |